Wavelet-Tuning
Cand.Real.
(Article
is under construction)
This article is based on a chapter in the book “Basic
Theory of Exploration Seismology” of Costain and Coruh and on a chapter in the
book “Reflection Seismology” by Kenneth
Waters. I have expanded Costain and Coruh’s discussion of Ricker Wavelet – put
in some thoughts from Waters, and done some computations in Mathematica.
The phe
There are excellent references in the literature on the thin-layer,
wavelet tuning, and resolution.
We have:
M.B.Widess: How thin is a thin bed? Geophys.
Prosp.38:1176:1180,1973
Kallweit, R.S and Wood,L.C. The Limits of resolution of zero-phase wavelets. Geophysics
476:1035-1046, 1982 [92]
Kallweit and Wood [92] reported on the
limits of resolution of reflections from thin beds and Berkhout [18, this Handbook
Series, Volume 12, p. 48] on the resolution and detect ability of thin beds.
The zero-phase wavelet is required for resolution as well as detectability
[18].
1.1 Resolution and Diffractions
In optics, an instrument is always
qualified by a number which describes, to the initiated, the limit of fineness
of detail that can be seen when the instrument is used. In the case of a
telescope, this is the angular separation between two points of light that can
just be resolved, that is, distinguished as separate. In light microscopes and
electron microscopes, the qualification is similar but is sometimes translated
into a linear measure. For example, it may be possible to resolve two points
(say)
It must be remembered that, in optics, we
are dealing with visible light having wavelengths from about 4000 to
In Fig.1. two Fraunhofer diffraction
curves have been added together with a separation such that the peak of one
curve lies at the first minimum of the other-such a separation occurs at an
angle equal to 0.61 (/I/a), where A is the wavelength of the light being used
and a is diameter of the telescope or microscope aperture being used.
There is

Fig.1.1. Fraunhofer
diffraction at a circular aperture. The function is y = [2 J(x)/x]2.
The sum of two Fraunhofer diffraction curves at separation 0.61 λ/a (Rayleigh
criterion).
1.2 SEISMIC
RESOLUTION
The question can be asked, What do we wish
to distinguish from what ? In a certain (physical) sense, we do
The most direct form of measurement uses
the various forms of logs obtained in holes drilled through formations, and
logs that contain information capable of being determined from seismic
measurements are:
1. P-wave velocity logs.
2. S-wave velocity logs.
3. Density logs.
A perfectly logged single hole gives
information applicable to a small volume around the hole, so that many holes
are necessary to give some of the geological information sought. A seismograph
would approach perfection if it could, in a vertical sense, measure the same
quantities as the three logs listed, to the same degree of detail.
One answer to the general question about
resolution is that we want to maximize the detail with which the vertical
variation of the two seismic velocities and the density are obtained. In other
words, we would like to be able to determine, as closely as one can using well
logs, the depths at which the lithology and connate fluids change.
In a
Finally, with only three parameters, the
bulk and shear moduli of elasticity and the density, that can physically affect
the seismic waves, even in the perfect case, how much k
These are complex questions which do
8.3 VERTICAL SEISMIC RESOLUTION
The
characteristics of reflections, as related to the velocity and density logs connected
to a relation between laminar velocity changes in the earth and reflection
coefficients :
dR
= ½ d(ln V) (1.1)
and this can be
extended, if the density also varies, to
dR =
½ d(ln Z) (1.2)
where Z is the acoustic impedance
of the rock— the product of the proper velocity and the density— which is a
function of the depth h or the two-way reflection time t. It is
possible to define a piecewise continuous function called the reflectivity:
r(t)=lim d/dt R = ½ d/dt(lnZ) (1.3)
It may be advisable to point out that the
reflection coefficients we have been dealing with have been obtained at
constant sampling rates. They really represent the product of the reflectivity
and the sampling rate, although this has
(1.4)
and
(1.5)
This gives a relationship which allows c
1. It is the impulse response (including
all multiples and transmission losses) that is actually responsible for the
seismic reflection trace.
2. This impulse response is very wide-band
in frequency and, to obtain the seismic record, it has to be filtered with the
effective bandwidth pulse received by the seismic system.
3. It is assumed that it is possible to
produce a seismic trace as though it has been generated by plane waves (i.e.,
the spherical divergence has been removed exactly).
4. It is assumed that the exact values
of the reflection coefficients are k
The effect of all these restrictions is to
limit the fidelity with which the acoustic impedance log can be displayed. It
is a seismic approximate impedance log (SAIL).

Fig.1.2.
The impulse response of isolated thin beds
These restrictions are
The sequence of impulses decays rapidly and in practice is important
only for very large velocity and density contrasts which occur, for example,
with thin coal beds in a siltstone matrix or for a gas sand in a
shale-water-sand environment. The values plotted in this and some following
diagrams are approximately 0.3—which is
Next, we have to deal with the situation that each pulse in the impulse
response has been filtered by the combination equipment-earth filter. It is
assumed that the equipment phase has


Fig.1.3
We first look at the effect of integrating the wide-band reflection
coefficient case. A perfect integrator can be regarded as a process or circuit
by which a delta function is transformed into a positive step function. This is
easily seen since, if the delta function occurs at a time τ, integration up to that time
yields zero, by the definition of the delta function. At time x, the integral
yields a unit value, which is retained for all times thereafter.
Mathematically,
(1.6)
= 1 (otherwise)
If such an integrator is applied to a sinusoidal wave train,
(1.7)
which shows that the integrated output has an amplitude that decreases
inversely as the frequency and is retarded in phase by n/2 radians.
Thus, for constant-amplitude input, doubling the frequency (an increase of one
octave) reduces the amplitude of the integrated output to one-half.
Figure 1.4 .shows the effect of approximating the delta function
by a narrow rectangular pulse to obtain an approximate step function—with a
steep ramp replacing the step because of the finite width of digital sampling.
The step function can also be regarded as the impedance change between the
upper and lower layer of the reflection. The amplitude is in arbitrary units
because,
1.The
high-frequency oscillations tend to die out more rapidly with time, the more
slowly the tapering is done at the high-frequency end.
2.The low-frequency oscillations on either side tend to die out more
rapidly with time, the more slowly the tapering is done at the low-frequency
end.
3.The central breadth of the autocorrelation function tends to increase, the
more tapering is done.
Various forms of taper have been used, but in practice the linear taper
is almost always employed.


Fig.1.4 Integration of an
approximation to a delta function
Figure
1.3 shows that, while the integration of a reflection impulse (whose spectrum
contains frequencies from zero to some high value connected with the thickness
of the pulse) gives an acoustic impedance change over a small interval of time
and the change remains after the impulse has passed, it is obvious that the
integration of the band-limited zero-phase pulse results in a fast change in
apparent impedance (controlled by the high-frequency end of the spectrum)
preceded, and followed, by slow decays controlled by the low-frequency end of
the spectrum. We are thus forcibly made aware of the need—in order to achieve
our goal of acoustic impedance fidelity— of a very wide band of frequencies.
Not only are the high frequencies important, but also the lows. This statement
is reinforced by several examples later.
We
Instead of the true impedance Z(t), we are
(1.8)
Provided that
is always small which,
in practice appears to be nearly true, the exponential term on the right can be
expanded, retaining only the constant and first-order terms:
(1.9)
Z(0) (1.10)
Thus the fractional change in impedance (as indicated by the SAIL trace)
is simply the seismic trace integrated and displayed on an arbitrary scale.
In the remainder of this section, the question of resolution is examined
from the point of view of the accuracy with which the variations in the actual
acoustic impedance can be forecast (from the surface) by the integration of
properly processed seismic traces.
Returning to the isolated thin-layer case, as a suitable starting point,
we
As far as the spectra are concerned, we k




In Figures 1.5 and 1.6 are shown the results of a model computer program
which computes the reflection response from a generalized layered system.
Models corresponding to 10, 20, 40, 60, 80, and
In these plots, the velocity log is first
displayed, showing the different layer thicknesses and the velocities just
mentioned. The first column then shows reflection coefficients, positive for
downgoing waves to the right. In this display, all vertical logs, except the
velocity log, are given their time amplitude relative to one a


Some features to be
1. All beds up to the 60-ft bed are thin
beds as far as both of the pulses are concerned. The amplitudes continue to
grow with bed thickness (although
2. For all these thin beds the
higher-frequency pulse output is larger than the lower-frequency output, but
the shape does
3. We do
4. Between 60 and
5. The output pulses from the thin layers
are very close to the original autocorrelation pulses, before integration. This
is because a positive pulse, followed closely by an equal and opposite pulse,
effectively differentiates the input pulse. Hence the integration has been
countered by the differentiation performed by the impulse response.
6. Both pulses effectively resolve the
separate edges of the 200-ft layer, producing a almost square-topped SAIL
trace, although it is evident that the layer indication starts from a base very
much lower than the reference line. The lack of low frequencies and zero
frequency make their effect felt.
7. The impulse response shows that the
predicted multiple reflections within the layer cause a slight tail, but their
effect is barely
In general, a single frequency is
reflected from the lower side of a thin layer of this type with a phase change
of 180°. Therefore, in order to emerge in phase with the reflection from the
upper surface, a phase change of an additional 180° must occur because of the
travel path. This happens when the layer has a thickness of one-quarter wavelength
for the frequency and velocities concerned. We would expect the maximum
amplitude reflection to occur when the layer is one-quarter of the wavelength
of the average frequency in a pulse. For the 7-901 pulse, the average frequency
must be near 48 Hz, and this, in a medium of 10,000 ft/sec velocity, has a
wavelength of
An output almost one-half of the maximum
is, however, given by a layer only one-sixth of the optimum thickness, and it
is evident that smaller reflection indications can be picked when the signal/
One other example has been presented (Figure 1.7) in which three
different thickness layers are included at different depths in the section.
There is
Discussions of resolution usually are based on the seismic pulse itself,
and some additional distinctions are made with respect to resolution and
definition, the former being the ability of an object to give a
high-frequency output—which may, however, be ringy if it is derived from a
spectrum that is too narrow (the light case can be regarded as an example in
which only the envelope of a narrow-band frequency wave is effective for
resolution; see Figure 1.8—while the latter is a measure of discreteness of he
pulse itself in which the waveform is useful in denning two closely spaced
objects. The discussions run somewhat parallel, but the direct explanation in
terms of the integrated waveform
Wavelet shaping in thin beds
Now we go
more into the concept of thin beds and we will differ between differentiating
and integrating.
It is
important to understand two facts that was illustrated on fig. 1.1:
1.A thin
bed acts as a differentiator when the top and bottom of the interval are
represented by reflection coefficient of opposite polarity.
2.A thin
interval acts as an integrator when the polarity of the reflection coefficients
is the same.
This can be
visualized by considering a single frequency like fig.1

When we
differentiate this frequency we get:

Integration
gives this result.

Fig.1.1.One cycle of a windowed cosine wave.
We
examine a zero phase Ricker wavelet defined by:
1.1
Fd is
the dominant frequency of the Ricker Wavelet and t is two-way travel time.
The breadth
of the Ricker wavelet in seconds is given by:
and is about 16 ms.
A Ricker wavelet with a 50-Hertz dominant frequency and its amplitude
spectrum are shown in Figure 2 .a

It is obvious that the Ricker wavelets reflected from the top and bottom
of an interval with opposite polarities will interact constructively when the
two-way thickness of the interval is equal to the one half of the wavelet
breadth. Similarly, the wavelets reflected from the top and bottom of an
interval with the same polarity will interact destructively when the two-way
thickness of the interval is equal to the one half of the wavelet breadth.
Interaction of the wavelets with opposite polarity will result in
differentiation where the effect of the differentiation is controlled by the
ratio between the two-way layer thickness and one-half of the wavelet breadth.
A differentiated Ricker wavelet
If the
reflection coefficients from the top and bottom of thin-layer have opposite
polarity, then the wavelet interaction acts as a differentiation. We will
regard this case first.
An
analytically differentiated Ricker wavelet is given by:
tfd2
e –(πfdt)2
(389.636364 (fd t)2 – 59.2176264) 1.2
and is shown in Figure 3.a.

Variation of the peak-to-trough amplitude of the composite wavelet
formed by the interaction is shown in Figure 3.b.

For a reflection coefficient of 0.25, the peak-trough amplitude of the
composite wavelet quickly increases from 0 (
Three snapshots that simulates wavelet interaction as the layer
thickness changes are shown in Figure 3.b. The curves, in order from low- to
high-amplitude, correspond to ratios of 0.142,1.0, and 1.57 between the two-way
layer thickness and half-breadth of the wavelet. The change in the amplitude
and shape of the composite wavelet demonstrate the importance of the effect of the thin-layer and tuning. It can easily lead to
misinterpretation such as false amplitude a

The amplitude spectra of the composite
wavelets given in Figure 3.c along with the spectrum of the original Ricker
wavelet, which is represented by the curve that has its peak at 50 Hertz, are
shown in Figure 3.d. The curve with a peak about 60 Hertz corresponds to the
ratio of 0.142 between the two-way layer thickness and half-breadth of the
wavelet while the curve with a peak around 40 Hertz represents the ratio of
1.57. The third curve with a peak at about 50 Hertz represents the ratio of
1.0. The general interpretation is that a thinning layer in the thinning
direction will first shift the frequency band to lower frequencies and then
shift it to higher frequencies. Therefore, recognition of the location of
tuning via this change in the amplitude spectra might lead to the estimation of
the layer thickness.

Fig.4.a-h shows the plots of the wavelet
in single plots. It is the same plots that are combined on fig. 3. For the same
layerthickness/one-half wavelet breadth one lot at a time:








Fig.4 shows
the same as fig.3.b but with a higher frequency with a constant breadth. We can
see that the breadth of the Ricker wavelet in the thin bed is bigger than on
fig.3. Fig.5.b shows the specter and this has a lower frequency.


Fig.1.3 Wavelet interaction as a
differentiation. Peak to through amplitude variation that results from the
differentiation of Ricker Wavelets as a function of two-way layer thickness and
one-half of the breadth of the wavelet.


Fig.4Differentiation
of amplityde spectrum. Curves identified with their peak from left to right
represent ratio 1.57,1.0, and 0.142 between layer thickness and half breadth of
the wavelet.
An integrated Ricker wavelet
If the reflection coefficients from the
top and bottom of a thin-layer have the same polarity, then the wavelet
interaction acts as an integration. The variation in the peak-trough amplitude
of the composite wavelet formed by such an interaction is shown in Figure 5.a

Again a reflection coefficient of 0.25 was
considered at the top and bottom of the layer. The peak-trough amplitude of the
composite (on fig.6.a) wavelet reaches its maximum at the smallest thickness
and decreases as the ratio between the two-way layer thickness and half-breadth
of the wavelet increases. The peak-trough amplitude has its minimum near the
ratio 1.0 and asymptotically reaches the peak-trough amplitude (0.36) of the
Ricker wavelet that is scaled by the reflection coefficient (0.25). The change
in the peak-trough amplitude between the minimum and maximum corresponds to a
variation of about 158%. The change in the maximum peak-trough amplitude over
the peak-trough amplitude of the Ricker wavelet scaled by the reflection
coefficient (0.25) is about 75%. Obviously, these percentage gains are
determined by the type and shape of the wavelet.

The change in the peak-trough amplitudes
will be greater with the relative increase in the amplitudes of the side lobes
of the wavelet. Three snapshots that simulates wavelet
interaction as the layer thickness changes are shown in Figure 6.. The curves,
in the order from shorter length to longer length of the composite wavelet,
correspond to the ratio of 0.142, 1.0, and 1.57 between the two-way layer
thickness and half-breadth of the wavelet. The change in the amplitude and
shape of the composite wavelet exhibit the importance of the effect of the thin
layer and tuning as an integration process. As in the case of wavelet
differentiation, wavelet integration can easily lead to misinterpretation such
as false amplitude a

Figure
.a6: Wavelet interaction as an integration. The thinnest layer thickness causes
the highest peak-trough amplitude with relatively shorter length of the
composite wavelet. The smallest peak-trough amplitude of the composite wavelet
occurs around the ratio of 1.0 between the two-way layer thickness and one-half
of the breadth of the wavelet.
The amplitude spectra of the composite
wavelets given in Figure 5.24 along with the spectrum of the original flicker
wavelet, which is represented by the curve that has its peak at 50 Hertz, are
shown in Figure 5.25. The curve with a peak about 60 Hertz corresponds to the
ratio of 0.142 between the two-way layer thickness and half-breadth of the
wavelet, while the curve with a peak around 40 Hertz represents the ratio of 1.57.

Figure
6.b: Effect of wavelet integration on amplitude Spectrum. The curves identified
with their peak from left to right represent the ratio of 1.57, 1.0, and 0.142
between the two-way layer thickness and half-breadth of the wavelet. The fourth
curve with the peak at 50 Hertz represents the original Ricker wavelet.
The third curve with a peak about 50 Hertz
represents the ratio of 1.0. The general interpretation is that, as in the case
of wavelet differentiation, a thinning layer in the thinning direction will
first shift the frequency band to lower frequencies and then will shift it to
higher frequencies. Wavelet integration results in a much more
The Ricker wavelet of 80 Hertz and its
analytically differentiated and integrated versions are shown in Figure 5.27
for comparison. The differentiated wavelet has smaller amplitudes than the
original wavelet while the integrated wavelet has larger amplitudes than the
original wavelet. In terms of shape change, the differentiated wavelet has a
phase shift of +π /2 while the integrated wavelet has - π /2 phase
shift with respect to the original Ricker wavelet of zero phase shift.
The general conclusion from the above
summary is that the shape and amplitude of the composite wavelet are
determined by the layer thickness (two-way) and the breadth of the wavelet.
Wavelet interaction caused by a thin layer can lead
to misinterpretations; however, it can also be used as an interpretation tool.
8.4 VERTICAL RESOLUTION AND RANDOM
NOISE
Any seismic trace taken in the real world consists of a mixture of
signal and other events which consist of all other energy unrelated to the
problem under discussion. On a single seismic trace, there is
However, in the case of random
T((a) = S(co) + N(ca) (8.6) The coefficient of coherence (Foster and
Guinzy, 1967) is given by
(8.7)
where x(t) and y(t) are stationary time series with power spectra
fxx(co) and /„.(«), respectively, and cross spectrum ./A,.(w).
It must be emphasized that estimates of coherence are made, and great
care is needed. The coefficient of coherence is related to the signal/
S(co) = N(co) :
Thus, if the coefficient of coherence is estimated, the average
One problem, which occurs very often in all discussions of seismic data,
is the proper correction for near-surface corrections. This problem is
aggravated if higher-than-
Corrected seismic traces to be composited should have the same
geology-related reflections occurring at the same time. They can be added
together after being scaled in amplitude by some
preselected weighting function. At most, the resultant composited trace has a
signal/
If a well is available in an area and
seismic reflection work is performed in its neighborhood, the coefficient of
coherence can be obtained between the synthetic trace resulting from the well
log information and the field trace(s) recorded in the vicinity. Since it is
evidence of the existence on the field traces of information at a particular
depth that is required, the synthetic record made should start from reflection
coefficients rather than from the impulse response. The reflection
coefficients can be filtered to correspond in power spectrum to the field
trace, but Foster and Guinzy (1967) have warned against the dangers with some
forms of filter. The minimum requirement for this form of analysis is
sufficient correspondence between the synthetic and field traces that a
corresponding lag window with consistent starting times can be employed. In
some cases, where formation alteration may be a problem, particular attention
may have to be paid to obtaining velocity information through the use of a
long-offset velocity tool in the hote and correcting the density measurements
for any formation alteration.
8.5 VERTICAL RESOLUTION AND DEPTH
OF PENETRATION
At some depths, the random
However, it has been shown that the
penetration of high frequencies directly into the earth and the return of
high-frequency energy from the target layers is limited by:
1. Attenuation through solid friction.
2. Loss of energy or change in frequency
by reverberations and transmission losses due to many layer boundaries.
To a first approximation, the loss of
amplitude follows an exponential law:
A(z) = /loe--a
= the attenuation constant combining both effects and can be written as
uflQc
f =
frequency
1/2 = specific dissipation
constant (effective for both effects) c = velocity
Then the loss, in decibels, in traveling a
distance d through the earth is
nfd
Decibel loss = 8.686 — Qc
the graph of which is a straight line.
Note that the loss is proportional to both d and / Figure 8.9
illustrates diagrammatically how either of these factors changes Ik spectrum
so that the high-frequency effective output drops below the
As an example, suppose that we wish to
propagate 200 Hz to the layers just below
The decibel loss at 30 Hz from some reference
level is The decibel loss at 200 Hz from the same reference level is 8.68671 x
200 x 10,000
20 x 7800
= 349.84 dB
A required gain in signal of 297.36 dB, or
about
Since this section is
Experiments with shear waves have
illustrated how drastic this exponential decay lay can be, and caution is
required that an objective is within the realms of possibility before
attempting very costly experimentation. At best, the results may be attainable
only in some types of lithological sections.
8.6 VERTICAL
RESOLUTION AND THE
CHARACTERISTICS OF NEAR-SURFACE VELOCITY LAYERING
It was previously stated that near-surface
layering, because of the reverberations produced and the effect of these
reverberations on the character of the downgoing pulse, can cause loss of high
frequencies. This loss is further accentuated by transmission of the
reflection pulse upward.
This situation is illustrated by three model
studies (Figures 8.10 through 8.12), in which the layering near the surface was
chosen to be alternating in characteristics of velocity and the layer
thicknesses were chosen randomly between 0 and
This impulse response change is reflected
in the synthetic reflection records. Whereas for the 10-layer case the 07-901
filter gives a sharper indication of velocity increase at a time of 0.53 sec,
by the time the 30-layer case is considered there is
The synthetic technique of inserting a
large, isolated velocity boundary below part of a log is a very useful one for
studying attenuation due to just reverberations.